Yazar "Duğan, S." için listeleme
-
Characterization of AlInN/AlN/GaN Heterostructures with Different AlN Buffer Thickness
Çörekçi, S.; Duğan, S.; Öztürk, M. K.; Çetin, S. S.; Çakmak, M.; Özçelik, S.; Özbay, E. (Springer, 2016)Two AlInN/AlN/GaN heterostructures with 280-nm- and 400-nm-thick AlN buffer grown on sapphire substrates by metal-organic chemical vapor deposition (MOCVD) have been investigated by x-ray diffraction (XRD), atomic force ...