Yazar "Asar, T." için listeleme
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Effects of Thermal Annealing and Film Thickness on the Structural and Morphological Properties of Titanium Dioxide Films
Çörekçi, S.; Kızılkaya, K.; Asar, T.; Öztürk, M. K.; Çakmak, M.; Özçelik, S. (Polish Acad Sciences Inst Physics, 2012)Titanium dioxide (TiO2) thin films having different thicknesses of 220, 260, and 300 nm were deposited onto well-cleaned n-type silicon substrates by reactive DC magnetron sputtering and annealed in the range of 200-1000 ...